Keyence Digital Microscopy
Non-Destructive Optical Inspections
Microscopy is the technical field of using microscopes to view samples and objects that cannot be seen with the unaided eye. Fracture analysis, fatigue, corrosion, and material flaws are topics of interest to be viewed under enhanced magnification
DVI's Experts have full access to a wide variety of optical and electron microscopes to support an accident investigation, including a state-of-the-art Keyence Digital Microscope.
Keyence VHX 6000 Digital Microscope
Capture Fully-focused Images in Seconds
Due to its high frame rate camera, the VHX can instantly scan through the focal range of a sample, recognize which areas are in focus, and build a fully-focused image. This provides users with more in-depth information and in a fraction of the time of conventional systems.
Automatically Adjusts the Direction of Light to Reveal Surface Features with the Push of a Button
Lighting is the most important factor when it comes to capturing images. Until now, taking full advantage of lighting was a difficult task when performing magnified observation. Now, thanks to KEYENCE's Multi-lighting function, surface features that were previously impossible to view become clear at just the push of a button.
View an object from any angle by tilting the lens up to 90 degrees and rotating the stage 180 degrees. Observing a target from various angles can now be done without having to manipulate the sample by hand. Users can even image large objects that traditionally could not be viewed with a microscope by using hand-held mode.
Users can perform any kind of measurement—including 2-point, angle, diameter, parallel line, and area—directly on the screen with just a few clicks of the mouse. Data can also be saved in an album and accessed later for further measurement.
3D Display & Measurement Functions
Using 3D data, the VHX-6000 makes it possible to measure at any targeted point. Data can be collected to calculate the profile, height, and volume for any area within the field-of-view.